M-30MRT Metallographic microscope

Product Introduction:

Provide superior image quality and stable and reliable mechanical structure, easy to operate, complete accessories, widely used in teaching research metallographic analysis, semiconductor silicon wafer detection, address mineral analysis, precision engineering measurement and other fields;

Optical System: Infinite Far chromatic aberration correction optical system (CSIS) , better image quality, higher resolution, more comfortable observation;

eyepiece and objective: high eye point, ultra wide field eyepiece, PL10X/22MM, provide more spacious and flat observation space and can be installed for measurement of various types of micrometers, infinite flat field achromatic ultra-long working distance professional metallographic objective lens, no cover glass design,

observation cylinder: Hinged binocular/triocular/digital integrated observation cylinder, adjustable visibility, 30 ° tilt, can be used for photography, the observation of the image collection and preservation, configuration of computer and professional software to achieve image analysis;

focusing mechanism: low hand position coarse fine adjustment coaxial focusing mechanism, coarse adjustment stroke 28 mm, fine adjustment accuracy 0.002 mm, with platform position up and down adjusting mechanism, sample height up to 50mm (reflection) , with coarse adjusting and tightening adjusting device and random limiting device;

lighting system: reflecting illuminator with Oblique lighting device, the special effect of relief stereoscopic can be produced when the fine structure is observed again, adaptive 90V-240V wide voltage, single 3w-led cold light source with high brightness.