- HardNess
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Metallurgical Equipment
- Metallographic sample cutting machine series
- Metallurgical mounted machine series
- Grinding machine
- Metallographic grinding prototype, polished machine, pre-mill series
- Polishing machine
- Metallographic polishing machine, grinding and polishing machine series
- Microscope
- Metallographic analysis system
- Electrolytic polishing corrosion tester
- Sample blower
- End quenching equipment
- Metallurgical Material
Contact:Miss zhang
Phone:021-51083791
Fax:021-51083792
Mobile:18930516192
Email:teshi@teshish.com
M-45X INVERTED METALLURGICAL MICROSCOPE
1. Product introduction
1. Total magnification (standard) : 50-500X, optional 100x objective (dry) , magnification up to 1000x. 2. Optical System: Infinite chromatic aberration correction optical system, better image quality, higher resolution, more comfortable observation; 3. Objective: Long Working Distance Professional metallographic objective, to provide good resolution and clear image. 4. EYEPIECE: high-point, ultra-wide field eyepiece, PL10X/22MM, provides wider and flatter viewing space and can be equipped with various micrometers for measurement. 5. Observation Cylinder: Hinged three-eyes, adjustable visibility, 45 ° tilt, photography, Observation Image collection and preservation, configuration of computer and professional software to achieve image analysis; 6. Focusing Mechanism: low-hand Position fine-tuning co-axial focusing mechanism, with coarse-tuning and tightening adjusting device, coarse-tuning 10 mm per rotation stroke, fine-tuning 0.2 mm per circle, grid value 0.002 mm; 7. Lighting System: Reflective Cora with variable diaphragm and center adjustable field diaphragm, adaptive 100V-240V wide voltage, 12V50W imported halogen lamp, effective protection and prolong the service life of Halogen Lamp; 8. Loading table: large working loading table, area up to 210 ~ 180 mm, moving range 50 ~ 50 mm, vernier scale 0.1 mm 9. Adjustable field-of-view and aperture light railings provide a good contrast 10. Polarizing and detecting polarizing inserts can provide polarizing observation. |